A4 Conference proceedingsThree-layer Approach to Detect Anomalies in Industrial Environments based on Machine Learning (2020)2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS)Gutierrez-Rojas Daniel, Ullah Mehar, Christou Ioannis T., Almeida Gustavo, Nardelli Pedro, Carrillo Dick, Sant’Ana Jean M., Alves Hirley, Dzaferagic Merim, Chiumento Alessandro, Kalalas Charalampos |