A4 Conference proceedings

Measurement of the bending of thin inclined nanowires as a method for determining elastic modulus


Open Access publication


Publication Details

Authors: Dunaevskiy M.S., Alekseev P.A., Geydt P., Lähderanta E, Haggren T., Lipsanen H.

Publisher: IOP Publishing: Conference Series

Publication year: 2018

Language: English

Related journal or series: IOP Conference Series: Materials Science and Engineering

Title of parent publication: IOP Conference Series: Materials Science and Engineering, Volume 443, conference 1

Volume number: 443

Issue number: 1

ISSN: 1757-8981

eISSN: 1757-899X

JUFO level of this publication: 1

Digital Object Identifier (DOI): http://dx.doi.org/10.1088/1757-899X/443/1/012006

Permanent website address: http://iopscience.iop.org/article/10.1088/1757-899X/443/1/012006/meta

Social media address: https://www.researchgate.net/publication/328941270_Measurement_of_the_bending_of_thin_inclined_nanowires_as_a_method_for_determining_elastic_modulus

Open Access: Open Access publication


Abstract

The method of measuring nanowires elastic modulus by scanning probe microscopy is presented. This method uses the measurement of nanowire bending profiles in the precise force control mode. The possibilities of the method are demonstrated by measuring the Young's modulus of thin tapered InP nanowires.


Last updated on 2019-13-03 at 12:00