A4 Conference proceedings

Three-layer Approach to Detect Anomalies in Industrial Environments based on Machine Learning


Open Access publication

Publication Details
Authors: Gutierrez-Rojas Daniel, Ullah Mehar, Christou Ioannis T., Almeida Gustavo, Nardelli Pedro, Carrillo Dick, Sant’Ana Jean M., Alves Hirley, Dzaferagic Merim, Chiumento Alessandro, Kalalas Charalampos
Publication year: 2020
Language: English
Title of parent publication: 2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS)
ISBN: 978-1-7281-6390-1
eISBN: 978-1-7281-6389-5
JUFO-Level of this publication: 1
Open Access: Open Access publication
Location of the parallel saved publication: https://arxiv.org/pdf/2004.09097.pdf

Last updated on 2020-10-12 at 11:11