A1 Journal article (refereed), original research

Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy


Publication Details
Authors: Dunaevskiy M., Alekseev P., Geydt P., Lähderanta E., Haggren T., Lipsanen H.
Publisher: MAIK Nauka/Interperiodica (МАИК Наука/Интерпериодика)
Publication year: 2019
Language: English
Related Journal or Series Information: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
Journal name in source: Journal of Surface Investigation
Journal acronym: Journal of surface investigation : x-ray, synchrotron and neutron techniques
Volume number: 13
Issue number: 1
Start page: 53
End page: 55
Number of pages: 3
ISSN: 1027-4510
eISSN: 1819-7094
JUFO-Level of this publication: 1
Open Access: Not an Open Access publication

Abstract

A scanning probe microscopy method that allows one to measure Young’s modulus of thin and flexible nanowires is developed, which consists in measuring the deflection profiles under conditions of precise force control. This method can be applied to any thin and flexible one-dimensional or two-dimensional object. Using this approach, Young’s moduli of thin InP conical nanowires with the wurtzite and zincblende structures are measured. It is found that nanowires with the pure wurtzite structure have a higher value of Young’s modulus than the nanowires containing alternating wurtzite–zincblende phases.


Last updated on 2020-20-03 at 10:03