A4 Conference proceedings

Measurement of the bending of thin inclined nanowires as a method for determining elastic modulus


Open Access publication

Publication Details
Authors: Dunaevskiy M.S., Alekseev P.A., Geydt P., Lähderanta E, Haggren T., Lipsanen H.
Publisher: IOP Publishing: Conference Series
Publication year: 2018
Language: English
Related Journal or Series Information: IOP Conference Series: Materials Science and Engineering
Title of parent publication: IOP Conference Series: Materials Science and Engineering, Volume 443, conference 1
Volume number: 443
Issue number: 1
ISSN: 1757-8981
eISSN: 1757-899X
JUFO-Level of this publication: 1
Open Access: Open Access publication

Abstract

The method of measuring nanowires elastic modulus by scanning probe microscopy is presented. This method uses the measurement of nanowire bending profiles in the precise force control mode. The possibilities of the method are demonstrated by measuring the Young's modulus of thin tapered InP nanowires.


Last updated on 2019-13-03 at 12:00

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