A1 Journal article (refereed), original research

Localization of dielectric breakdown defects in multilayer ceramic capacitors using 3D X-ray imaging


Open Access publication

Publication Details
Authors: Ingman Jonny, Jormanainen Joni, Vulli Aleksi, Ingman Jimmy, Maula Kari, Kärkkäinen Tommi, Silventoinen Pertti
Publisher: Elsevier
Publication year: 2019
Language: English
Related Journal or Series Information: Journal of the European Ceramic Society
Volume number: 39
Issue number: 4
Start page: 1178
End page: 1185
Number of pages: 8
ISSN: 0955-2219
JUFO-Level of this publication: 2
Open Access: Open Access publication
Location of the parallel saved publication: http://urn.fi/URN:NBN:fi-fe2018092736730

Abstract

In this article, a non-destructive method using 3D X-ray imaging to find dielectric breakdowndefects in multilayer ceramic capacitors (MLCCs) aged by high temperature and high voltage in an accelerated test is presented. In total, 64 aged samples were investigated using 2D X-ray imaging and half of them were further analysed with 3D X-ray imaging. Miniscule dielectric breakdown defects located in the MLCC active region are extremely difficult to identify solely using cross-section analysis or 2D X-ray imaging. In this study, the information provided by the 3D X-ray analysis was used to localize the defects for cross-section analysis. Cross-section analysis was performed to verify the dielectric breakdowns and their locations. 3D X-ray imaging is an effective method for detecting dielectric breakdown defects in MLCCs due to its short analysis time and high accuracy. This further facilitates failure analysis processes by providing the required grinding depth in cross-section analysis procedures.


LUT Focus Areas

Last updated on 2019-12-04 at 09:48