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Tehoelektroniikan luotettavuus

LUT Authors / Editors Kärkkäinen, Tommi (Laboratory of Applied Electronics)

Publication Details Authors: Kärkkäinen Tommi Publication year: 2018 Language: Finnish Title of parent publication: Sähkön laadun hallinta -asiantuntijaseminaari JUFO-Level of this publication: Open Access: Not an Open Access publication

Projects

Akustinen emissio tehoelektroniikan puolijohdemoduuleissa Acoustic Emission in Power Semiconductor Modules (01/09/2014 - 31/08/2018) Finnish Solar Revolution FSR (01/06/2016 - 31/12/2018)

Research Areas Electrical and Electronic Engineering Safety, Risk, Reliability and Quality

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Last updated on 2018-05-03 at 13:26